FIB-SEM and Tof SIMS at Curtin University

Article source: Release time:2024-03-15 11:30 Author: Views:650 Automatic translation:yes
Reporter:孙潇 研究员(澳大利亚科廷大学)
  
Time:2023年12月22日(星期五)14:00-15:00
  
Place:地质学系305教室
  
Description:
  

Researcher Sun Xiao is a researcher at the John de Laeter Centre (JdLc) at Curtin University in Australia. I graduated with a bachelor's degree from Xi'an Jiaotong University and a doctoral degree from the University of Western Australia in Australia. Researcher Sun Xiao has extensive experience in micro/nano manufacturing and material/device analysis. Currently, my research mainly focuses on the application of dual focused ion beam (FIB) and time-of-flight secondary ion mass spectrometry (Tof SIMS) in mineral analysis and nanoscale mineral analysis. This report will introduce the operation and successful application cases of FIB-SEM and Tof-SIMS devices at Curtin University